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Download An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns PDF

By Gordon Roberts, Friedrich Taenzler, Mark Burns

With the proliferation of advanced semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, brand new engineer has to be fluent in all 4 circuit kinds. Written for complicated undergraduate and graduate-level scholars, in addition to engineering pros, An Introduction to Mixed-Signal IC attempt and Measurement, moment version, encompasses analog, mixed-signal and radio-frequency circuits exams, with many correct commercial examples. The textual content assumes a superior heritage in analog and electronic circuits and a operating wisdom of pcs and laptop programming.

An creation to Mixed-Signal IC attempt and Measurement, moment version, comprises examples and illustrations--featuring cutting-edge commercial technology--to increase and liven up the textual content. The e-book additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added merits of mixed-signal IC trying out to a manufacturer's product, and obviously defines the function of the try engineer.

New to This Edition
* a brand new bankruptcy on RF try out equipment and basics of RF Testing
* a brand new bankruptcy on Clock and Serial info Communications Channel Measurements
* assurance of RF load board design
* New assurance of probabilistic reasoning for mixed-signal checking out

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Additional info for An Introduction to Mixed-Signal IC Test and Measurement

Example text

Test head Prober In addition to providing a temporary connection to the DUT, handlers are also responsible for sorting the good DUTs from the bad ones based on test results from the ATE tester. Some handlers also provide a controlled thermal chamber where devices are allowed to “soak” for a few minutes so they can either be cooled or heated before testing. Since many electrical parameters shift with temperature, this is an important handler feature. 4 E-Beam Probers Electron beam probers, or e-beam probers as they are often called, are used to probe internal device signals while the device is being stimulated by the tester.

During a mixed-signal test, the repeating frame vectors must be combined with the nonrepeating digital signal sample information to form a repetitive sampling loop. Combining the digital frame vectors with digital signal data, a long sequence of waveform samples can be sent to or captured from the DUT with a very short digital frame pattern. In effect, the sampling frame results in a type of data compression that minimizes the amount of vector memory needed for the tester’s digital subsystem. Looping frames are commonly used when testing DACs and ADCs.

Either a customer requests a particular type of product to fill a specific requirement, or a marketing organization realizes an opportunity to produce a product that the market needs. In either case, systems engineers help define the technical requirements of the new product so that it will operate correctly in the endequipment application. The systems engineers are responsible for defining and documenting the customer’s requirements so that the rest of the engineering team can design the product and successfully release it to production.

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